Guide: Convert Bruker EBSD bcf files to hdf5
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Electron backscatter diffraction (EBSD) within a scanning electron microscope (SEM) is a valuable technique to analyze the crystal structure on the surface. An electron backscatter pattern (EBSP) forms from the coherently scattered backscatter electrons and is acquired with a suitable detector at each electron-beam position, resulting in a 4-dimensional dataset: The scan positions (\(x\), \(y\)) and coordinates in the diffraction pattern (\(k_x\), \(k_y\)).